Defect evolution in Al/Cu and Al/Ni bilayers during annealing

Bent Nielsen, SM Heald, WTriftshauser, KG Lynn, E Barrera, J Jayanetti
Publication year: 1989

Defect evolution in Al/Cu and Al/Ni bilayers during annealing, Proceedings of the MRS Meeting, Boston, USA, Fall (1989); Bent Nielsen, SM Heald, WTriftshauser, KG Lynn, E Barrera, J Jayanetti