X-ray reflectivity study of thin film density for Al, Cu, Ni, Co, Cr, Mn and Pd, National Synchrotron Light Source

SM Heald, Zhengquan Tan, JKD Jayanetti
Publication year: 1991

X-ray reflectivity study of thin film density for Al, Cu, Ni, Co, Cr, Mn and Pd, National Synchrotron Light Source, Annual Report, Brookhaven National Laboratory, USA (1991) 178; SM Heald, Zhengquan Tan, JKD Jayanetti